NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

MgO/Mg

Mg*O/Mg

magnesium oxide/magnesium

CAS Registry No:

1309-48-4

Class:

oxide

Citation:

Author Name(s):

Peng X.D., Barteau M.A.

Journal:

Surf. Sci. 224, 327

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

51.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Mg2p3=49.79

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Thin films were formed on the Mg(0001) single crystal (99.999 % purity) surface by a ~100 L exposure to O2.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300