NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(C₆H₅)C(NOH)C(H)₂N(H)S(O₂)(C₆H₅)

XPS Formula:

(C₆H₅)C(N*OH)C(H)₂N(H)S(O₂)(C₆H₅)

Name:

N-(2-hydroxyimino-2-phenyl-ethyl)-benzenesulfonamide

CAS Registry No:

Class:

nitrogen, oxygen, phenyl benzene, sulfonyl, sulfur

Citation:

Author Name(s):

Doring M., Rudolph M., Uhlig E., Nefedov V.I., Salyn I.V.

Journal:

Z. Anorg. Allg. Chem. 532, 65

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

399.80

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300