NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Hf

Hf

hafnium

CAS Registry No:

7440-58-6

element

Citation:

Author Name(s):

Morant C., Galan L., Sanz, J.M.

Surf. Interface Anal. 16, 304

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV)

14.31

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5=368.2

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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