NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(C₆H₄SSe)n

(C₆H₄S*Se)n

poly(selenolo[3,2-b] thiophene)

CAS Registry No:

Class:

multiple rings, other ring, polymer, sulfur

Citation:

Author Name(s):

Lazzaroni R., de Prijck A., Riga J., Verbist J., Bonhomme C., Brose F., et al.

Journal:

Synthetic Metals 18, 123

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300