NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

silicon

7440-21-3

element, II-VI semiconductor, IV semiconductor

Citation:

Author Name(s):

Klasson M., Berndtsson A., Hedman J., Nilsson R., Nyholm R., Nordling C.

Journal:

J. Electron Spectrosc. Relat. Phenom. 3, 427

DOI:

Pub Year:

1974

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

KL₂₃L₂₃(¹D)

1616.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

CrK,Au3d5-4f7=2122.9

Charge Reference:

Conductor

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):