There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Si3N4
silicon(IV) nitride
12033-89-5
nitride, silicide

Citation:
Donley M.S., Baer D.R., Stoebe T.G.
Surf. Interface Anal. 11, 335
Pub Year:
1988

Data Processing:
Auger-Electron Line
KL23L23(1D)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙