There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
gallium nitride
25617-97-4
II-VI semiconductor, III-V semiconductor, nitride

Citation:
Carin R., Deville J.P., Werckmann J.
Surf. Interface Anal. 16, 65
Pub Year:
1990

Data Processing:
Auger-Electron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙