NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

copper

7440-50-8

element

Citation:

Author Name(s):

Kowalczyk S.P., Pollak R.A., McFeely F.R., Ley L., Shirley D.A.

Journal:

Phys. Rev. B 8, 2387

DOI:

Pub Year:

1973

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

L₃M₄₅M₄₅(¹G)

918.10

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL, Zn2p3-3d=1011.7

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):