There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ge
Formula:
GeSe3
Name:
germanium(VI) selenide
CAS Registry No:
Class:
chalcogenide, IV-VI semiconductor, selenide

Citation:
Author Name(s):
Ueno T.
Journal:
Jpn J. Appl. Phys. 22, 1349
Pub Year:
1983

Data Processing:
Data Type:
Auger-Electron Line
Line Designation:
L3M45M45(1G)
Kinetic Energy (eV)
1141.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙