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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
GeSe2
germanium diselenide
12065-11-1
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Jpn J. Appl. Phys. 22, 1349
Pub Year:
1983

Data Processing:
Auger-Electron Line
L3M45M45(1G)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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