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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ga
Formula:
GaP
Name:
gallium phosphide
CAS Registry No:
12063-98-8
Class:
chalcogenide, II-VI semiconductor, III-V semiconductor, phosphide

Citation:
Author Name(s):
Nishitani R., Iwasaki H., Mizokawa Y., Nakamura S.
Journal:
Jpn. J. Appl. Phys. 17, 321
DOI:
Pub Year:
1978

Data Processing:
Data Type:
Auger-Electron Line
Line Designation:
L3M45M45(1G)
Kinetic Energy (eV)
1065.60
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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