NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdTe

cadmium telluride

1306-25-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Lynn L.C., Opila R.L.

Journal:

Surf. Interface Anal. 15, 180

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

M₅N₄₅N₄₅

473.50

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu LMM=916;Cu MVV=58

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):