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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
cadmium sulfide
chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, organometallic, sulfide

Citation:
Gaarenstroom S.W., Winograd N.
J. Chem. Phys. 67, 3500
Pub Year:
1977

Data Processing:
Auger-Electron Line
M5N45N45(1G)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag,Cu
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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