NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
Si
Si
silicon
7440-21-3
element, II-VI semiconductor, IV semiconductor
Citation:
Barrie A., Drummond I.W., Herd Q.C.
J. Electron Spectrosc. Relat. Phenom. 5, 217
Pub Year:
1974
Data Processing:
Doublet Separation for Photoelectron Lines
DS-2p
Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):