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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Bi
Formula:
Bi
Name:
bismuth
CAS Registry No:
7440-69-9
Class:
element

Citation:
Author Name(s):
McGilp J.F., Weightman P., McGuire E.J.
Journal:
J. Phys. C. 10, 3445
DOI:
Pub Year:
1977

Data Processing:
Data Type:
Doublet Separation for Photoelectron Lines
Line Designation:
DS-4f
Double Separation (eV)
5.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Onset of secondary emission
Charge Reference:
Energy Scale Evaluation:
Comment:
On = onset of secondary emission

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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