Tab Page Summary
silicon(IV) dioxide (Quartz)
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate
Kovacich J.A., Lichtman D.
J. Electron Spectrosc. Relat. Phenom. 35, 7
Separation from the Strongest Auger Line
Overall Energy Resolution (eV):
Calibration:
Cu3s=122.4;2p3=932.5
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):