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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
silicon
element, II-VI semiconductor, IV semiconductor

Citation:
Carlson T.A., Dress W.B., Nyberg G.L.
Phys. Scripta 16, 211
Pub Year:
1977

Data Processing:
Separation from the Strongest Auger Line
SA-KL1L1(1S)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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