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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
silicon carbide
carbide, II-VI semiconductor, IV semiconductor, IV-VI semiconductor, silicide

Citation:
West R.H., Castle J.E.
Surf. Interface Anal. 4, 68
Pub Year:
1982

Data Processing:
Auger Parameter
AP-1s, KL23L23(1D)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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