NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ga

Ga

gallium

CAS Registry No:

7440-55-3

element

Citation:

Author Name(s):

Evans S.

Surf. Interface Anal. 7, 299

Pub Year:

1985

bookAll Records in this Publication

Data Processing:

Auger Parameter

Line Designation:

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

Auger Parameter (eV)

2184.75

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3-Au4f7=848.67

Charge Reference:

Energy Scale Evaluation:

Calibration study

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙