NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ga

Ga

gallium

CAS Registry No:

7440-55-3

element

Citation:

Author Name(s):

Iwakuro H., Tatsuyama C., Ichimura S.

Jpn. J. Appl. Phys. 21, 94

Pub Year:

1982

bookAll Records in this Publication

Data Processing:

Auger Parameter

Line Designation:

AP-3d, L₃M₄₅M₄₅(¹G)

Auger Parameter (eV)

1086.60

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au

Charge Reference:

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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