NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Sn

Sn

tin

CAS Registry No:

7440-31-5

element

Citation:

Author Name(s):

Venezia A.M., Cavell R.G.

J. Electron Spectrosc. Relat. Phenom. 36, 281

Pub Year:

1985

bookAll Records in this Publication

Data Processing:

Auger Parameter

Line Designation:

AP-3d_5/2, M₄N₄₅N₄₅

Auger Parameter (eV)

922.14

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Vacuum Ne1s=870.27 (Ne2s=48.47)

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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