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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
aluminum nitride
24304-00-5
III-V semiconductor, nitride

Citation:
Taylor J.A., Rabalais J.W.
J. Chem. Phys. 75, 1735
Pub Year:
1981

Data Processing:
Chemical Shift
CS-KL23L23(1D)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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