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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Al
Formula:
AlN
Name:
aluminum nitride
CAS Registry No:
24304-00-5
Class:
III-V semiconductor, nitride

Citation:
Author Name(s):
Taylor J.A., Rabalais J.W.
Journal:
J. Chem. Phys. 75, 1735
DOI:
Pub Year:
1981

Data Processing:
Data Type:
Chemical Shift
Line Designation:
CS-AP-2p,KL23L23(1D)
Chemical Shift (eV)
-3.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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