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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiO2/Si
silicon dioxide/silicon
element, IV semiconductor, non-stoichiometric oxide, oxide

Citation:
Contour J.P., Massies J., d'Avitaya F.A.
J. Vac. Sci. Technol. B 5, 908
Pub Year:
1987

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
LEED 2x1 pattern.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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