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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
AlOx/Al
aluminum oxides/aluminum
anhydride, catalyst, element, non-stoichiometric oxide, oxide

Citation:
Summers W.R., McAfee C.D., Schweikert E.A.
Nucl. Instruments Methods in Phys. Res. Sec. B 34, 89
Pub Year:
1988

Data Processing:
Chemical Shift

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Native oxide with thickness of 47+-11 A as determined by sputter rate of Al2O3.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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