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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Yb/GaP
ytterbium/gallium phosphide
III-V semiconductor, lanthanide, phosphide, rare earth

Citation:
Duo L., Sancrotti M., Cosso R., Addato S.D., Ruocco A., Nannarone S., et al.
Phys. Rev. B 42, 3478
Pub Year:
1990

Data Processing:
Surface Core-level Shift
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
80
Overall Energy Resolution (eV):
0.42
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
2 ML were deposited onto lightly doped n-type GaP(110). Evaporation rates of Yb were monitored with a quartz microbalance.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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