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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
P3N5Ox
oxygen atoms double bonded to phosphorus atoms
phosphorus oxynitride
IV semiconductor, nitride, non-stoichiometric oxide

Citation:
Quan D.T., Le Bloa A., Hbib H., Bonnaud O., Meinel J., Quemerais A., et al.
Revue Phys. Appl. 24, 545
Pub Year:
1989

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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