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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Au
Formula:
Au45Si55
XPS Formula:
Au45Si55Ox
Name:
gold silicide (Au45Si55)
CAS Registry No:
Class:
non-stoichiometric oxide, silicide

Citation:
Author Name(s):
Cros A., Saoudi R., Hewett C.A., Lau S.S., Hollinger G.
Journal:
J. Appl. Phys. 67, 1826
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f7/2
Binding Energy (eV)
84.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.65
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
0.7
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Samples with compositional spanning the entire Au-Si phase diagram were prepared by electron beam evaporation of gold-silicon mixture. The film were approximately 50 nm thick.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Rutherford Backscattering Spectrometry
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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