Tab Page Summary
IV-VI semiconductor, silicide
Sullivan J.P., Hirano T., Komeda T., Meyer III H.M., Trafas B.M., Waddill G.D et al.
Appl. Phys. Lett. 56, 671
Anode Material:
other source
Overall Energy Resolution (eV):
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
MoSi2(001)-(1x1). Excitation energy was 35 - 135 eV. The energy is referenced to the bulk state of the Si2p line.
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
293