There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
ZrN0.68
zirconium nitride (ZrN0.68)
nitride

Citation:
Takano I., Isobe S., Sasaki T.A., Baba Y.
Appl. Surf. Sci. 37, 25
Pub Year:
1989

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The metal was implanted with 6 keV N2+ ions at the angle of 25 degree from the surface normal. The current density was 8 mkA/cm-2. Fluence was 9.6E16 ions/cm-3

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

An error has occurred. This application may no longer respond until reloaded. Reload 🗙