Tab Page Summary
II-VI semiconductor, III-V semiconductor, phosphide
Trafas B.M., Aldao C.M., Capasso C., Shapira Y., Boscherini F., Vitomirov I.M.
mixed Gaussian/Lorentzian
Anode Material:
other source
Overall Energy Resolution (eV):
0.4
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Sn-doped InP(11O).
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
293