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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Bi1.1Ge28.0Se70.9
Bi1.1Ge*28.0Se70.9
bismuth germanium selenium alloy (1.1-28.0-70.9)
alloy, chalcogenide, glass, IV-VI semiconductor

Citation:
Mytilineou E., Kounavis P., Chao B.S.
J. Phys. Cond. Matter 1, 4687
Pub Year:
1989

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Thin films of amorphous chalcogenite alloys were prepared by sputtering in Ar atmosphere. X-ray energy-dispersive spectrometry was utilized to determine the film compositions.

Specimen:
Method of Determining Specimen Composition:
Energy Dispersive Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

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