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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiCl2/Si
Si*Cl2/Si
silicon dichloride
13569-32-9
chloride, element, IV-VI semiconductor, silane

Citation:
Whitman L.J., Joyce S.A., Yarmoff J.A., McFeely F.R., Terminello L.J.
Surf. Sci. 232, 297
Pub Year:
1990

Data Processing:
Chemical Shift
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
130
Overall Energy Resolution (eV):
0.1
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1.89 ML Cl2/Si(111)-(7x7), n-doped with 1 Ohm cm resistivity. The energy is referenced to the bulk state of the Si2p line

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

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