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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Hg0.86Mn0.14Se
Hg*0.86Mn0.14Se
mercury manganese selenide
IV-VI semiconductor, selenide

Citation:
Wall A., Caprile C., Fransiosi A., Vaziri M., Reifenberger R., and Furdyna J.K.
J. Vac. Sci. Technol. A 4, 2010
Pub Year:
1986

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
other source
X-ray Energy:
Overall Energy Resolution (eV):
0.3
Calibration:
FL
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The binding energy scale is referred to the Fermi level, obtained by evaporating 50 to 100 A Cr films on the cleaved surface.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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