NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[((C₆H₅)₃P=CH₂)₃TeCl]Cl₃

XPS Formula:

[((C₆H₅)₃P=CH₂)₃TeCl]Cl*₃

Name:

chlorotris(methylenetriphenylphosphorane) tellurium(IV) trichloride

CAS Registry No:

Class:

chloride, organometallic, phenyl benzene

Citation:

Author Name(s):

Konno H., Yamamoto Y.

Journal:

Bull. Chem. Soc. Jpn. 61, 2990

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

196.60

0.3

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Ylide-metal complex. Samples were placed on a gold mesh holder.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

180-200