NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Hg

Hg₀.₇₈Cd₀.₂₂Te

mercury cadmium telluride

CAS Registry No:

chalcogenide, II-VI semiconductor, telluride

Citation:

Author Name(s):

Wall A., Caprile C., Fransiosi A., Reifenberger R., Debska U.

J. Vac. Sci. Technol. A 4, 818

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

5d_3/2

Binding Energy (eV)

10.22

Energy Uncertainty:

0.07

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

40-160

Overall Energy Resolution (eV):

0.3

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The Fermi level was determined by deposition of 50-100 A Cr film in situ onto the cleaved surface. Overall energy resolution was in range 0.4 - 0.6 eV.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293

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