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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
aluminum stibnide
25152-52-7
III-V semiconductor, stibnide

Citation:
Yu E.T., Croke E.T., Chow D.H., Collins D.A., Phillips M.C., McGill T.G., et al
J. Vac. Sci. Technol. B 8, 908
Pub Year:
1990

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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