NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ZnTe

ZnTe*

zinc telluride

1315-11-3

chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Yu E.T., Croke E.T., Chow D.H., Collins D.A., Phillips M.C., McGill T.G., et al

Journal:

J. Vac. Sci. Technol. B 8, 908

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

4d_5/2

39.44

0.06

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300