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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cs
Formula:
CsC8
Name:
cesium octacarbon
CAS Registry No:
12079-66-2
Class:
alkali

Citation:
Author Name(s):
Estrade-Szwarckopf H., Rousseau B.
Journal:
J. Phys. Chem. Solids 53, 419
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-3d5/2
Surface Core-Level Shift (eV)
2.10
Energy Uncertainty:
0.2
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
2.4
Lorentzian Width (eV):
0.39

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Cs-intercallated compound. Asymmetry parameter = 0.13. The relative intensities of the surface component were 0.20 and 0.50 at emission angles 0 and 70 degrees, respectively. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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