NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-C₆H₄C(CH₃)₂C₆H₄OC(O)O^-)n/C

XPS Formula:

(^-C₆H₄C(CH₃)₂C₆H₄OC*(O)O^-)n/C

Name:

poly(oxycarbonyloxy-1,4-phenylene(1-methylethylidene)-1,4-phenylene-)/carbon

CAS Registry No:

24936-68-3

Class:

ester, oxygen, phenyl benzene, polymer, thin film

Citation:

Author Name(s):

Apai G., McKenna W.P.

Journal:

Langmuir 7, 2266

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

290.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Thin films (75-100 A) were dip cast onto highly oriented pyrolytic graphite. The thickness was measured by XPS. bisphenol-A-polycarbonate

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300