NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(VO)₂.₅C₇₄.₆N₂₀.₈

XPS Formula:

carbon atoms not attached to N

Name:

oxovanadium phthalocyanine

CAS Registry No:

Class:

multiple rings, organometallic, phthalocyanine

Citation:

Author Name(s):

Ewen R.J., Honeybourne C.L.

Journal:

J. Phys. Cond. Matter 3, S303

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

1s, sat

287.85

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The film was prepared by vacuum sublimation. The relative intensity was 0.08. Bulk formula: C32H16N8OV

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300