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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Bi4Ge20Se76
bismuth germanium selenium alloy (4-20-76)
alloy, chalcogenide, IV-VI semiconductor, thin film

Citation:
Kumar S., Kashyap S.C., Chopra K.L.
J. Appl. Phys. 72, 2066
Pub Year:
1992

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
n-type Bi4Ge20Se76. Bi content was determined by AES and atomic absorption spectrophotometry. FAT mode.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction, Transmission Electron Microscopy
Specimen Temperature (K):
300

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