NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Na₂O(SiO₂)₈

XPS Formula:

Na₂O(SiO₂)₈ non^-bridging oxygen

Name:

sodium silicate (Na2O(SiO2)8)

CAS Registry No:

Class:

alkali, glass, oxide

Citation:

Author Name(s):

Sprenger D., Bach H., Meisel W., Gutlich P.

Journal:

J. Non-cryst. Solids 126, 111

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

529.80

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was broken under UHV. The intensity ratio of the Gaussian/Lorentzian components was 0.55.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300