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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
(-CH2C(CH3)(C(O)OCH2CH2OC(O)CH2C(O)CH3)-)n
XPS Formula:
(-C*H2C(C*H3)(C(O)OCH2CH2OC(O)CH2C(O)CH3)-)n
Name:
poly(2-(acetoacetyloxy)ethyl 2-methylacrylate)
CAS Registry No:
Class:
ester, ketone, oxygen, polymer

Citation:
Author Name(s):
Lopez G.P., Castner D.G., Ratner B.D.
Journal:
Surf. Interface Anal. 17, 267
DOI:
Pub Year:
1991

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
284.80
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Calibration: the difference between the Cu2p3/2 and the Cu3s peaks was 810.1 eV. An electron flood gun was used for charge compensation. The curve-fitting procedure was made in accordance with the stoichiometry. The composition determined by XPS was C2.2O

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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