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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
gallium(III) arsenide
arsenide, II-VI semiconductor, III-V semiconductor

Citation:
Cossu G., Ingo G.M., Mattogno G., Padeletti G., Proietti G.M.
Appl. Surf. Sci. 56, 81
Pub Year:
1992

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
GaAs(100). For calibration, the CuL3M45M45 transition at 567.97 eV was also used.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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