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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
silicon carbide
carbide, II-VI semiconductor, IV semiconductor, IV-VI semiconductor, silicide

Citation:
Contarini S., Howlett S.P., Rizzo C., De Angelis B.A.
Appl. Surf. Sci. 51, 177
Pub Year:
1991

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The powder was deposited in a flat cup-shaped sample holder.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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