NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

indium

7440-74-6

element

Citation:

Author Name(s):

Riffe D.M., Wertheim G.K., Buchanan D.N.E., Citrin P.H.

Journal:

Phys. Rev. B 45, 6216

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4d

Surface Core-Level Shift (eV)

0.00

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.075

Lorentzian Width (eV):

0.28

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

40.8

Overall Energy Resolution (eV):

.075

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

In(100). The SCLS was less than 0.1 eV. Singularity index = 0.14.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

78, 295