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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
copper(I) sulfide
22205-45-4
chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:
Deroubaix G., Marcus P.
Surf. Interface Anal. 18, 39
Pub Year:
1992

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
A pure copper sample was first annealed under H2 (T = 1173 K, time = 90 min) and the sulfided in a gas mixture H2/H2S (T = 873 K, time = 6 h).

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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