NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cu

Cu₂S

copper(I) sulfide

CAS Registry No:

22205-45-4

chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Deroubaix G., Marcus P.

Surf. Interface Anal. 18, 39

Pub Year:

1992

book All Records in this Publication

Data Processing:

Auger-Electron Line

Line Designation:

L₃M₄₅M₄₅(¹G)

Kinetic Energy (eV)

916.80

Energy Uncertainty:

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

A pure copper sample was first annealed under H2 (T = 1173 K, time = 90 min) and the sulfided in a gas mixture H2/H2S (T = 873 K, time = 6 h). For calibration, the Cu L3M45M45 transition at 334.95 eV was also used.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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