NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CuI

Cu*I

copper(I) iodide

7681-65-4

II-VI semiconductor, iodide

Citation:

Author Name(s):

Engelhardt L.M., Healy P.C., Shepherd R.M., Skelton B.W., White A.H.

Journal:

Inorg. Chem. 27, 2371

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

931.90

Background Subtraction Method:

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3 = 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Cubic structure, space group I4-3d. Crystalline needles.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300